Abstract

We present what we believe is a novel technique based on the moiré effect for fully diagnosing the beam quality of an x-ray laser. Using Fresnel diffraction theory, we investigated the intensity profile of the moiré pattern when a general paraxial beam illuminates a pair of Ronchi gratings in the quasi-far field. Two formulas were derived to determine the beam quality factor $M^2$ and the effective radius of curvature $R_e$ from the moiré pattern. On the basis of the results, the far-field divergence, the waist location, and the radius can be calculated further. Finally, we verified the approach by use of numerical simulation.

© 1999 Optical Society of America

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