Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Pseudodielectric functions of uniaxial materials in certain symmetry directions

Not Accessible

Your library or personal account may give you access

Abstract

The pseudodielectric function is often used to represent ellipsometric data and corresponds to the actual dielectric functions of materials when there is no surface overlayer and the material is isotropic. If a uniaxial material is oriented such that the optic axis is in the plane of incidence or is perpendicular to the plane of incidence, then the cross-polarization terms are zero and appropriate pseudodielectric functions can be determined from the ellipsometry data. We calculate the pseudodielectric functions for uniaxial crystals in three primary symmetry directions: (1) the optic axis is perpendicular to the plane of incidence, (2) the optic axis is in the plane of the sample surface and parallel to the plane of incidence, and (3) the optic axis is in the plane of the sample surface and perpendicular to the plane of incidence. These results are expanded in terms of the difference in the ordinary and extraordinary dielectric functions and compared with the approximation of Aspnes [J. Opt. Soc. Am. 70, 1275 (1980)] . Comparisons are made with experimental results on oriented crystals of rutile (TiO2), and a simple procedure is presented to determine the complex dielectric function from standard ellipsometry techniques.

© 2006 Optical Society of America

Full Article  |  PDF Article
More Like This
Ellipsometry: dielectric functions of anisotropic crystals and symmetry

Gerald E. Jellison, Nikolas J. Podraza, and Ambalanath Shan
J. Opt. Soc. Am. A 39(12) 2225-2237 (2022)

Measurement of the optical functions of uniaxial materials by two-modulator generalized ellipsometry: rutile (TiO2)

G. E. Jellison, F. A. Modine, and L. A. Boatner
Opt. Lett. 22(23) 1808-1810 (1997)

Extension of rotating-analyzer ellipsometry to generalized ellipsometry: determination of the dielectric function tensor from uniaxial TiO2

Mathias Schubert, Bernd Rheinländer, John A. Woollam, Blaine Johs, and Craig M. Herzinger
J. Opt. Soc. Am. A 13(4) 875-883 (1996)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Figures (8)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Equations (28)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved