Abstract
The optical constants of electron-beam evaporated boron from 6.8 to were calculated through transmittance measurements of boron thin films deposited onto carbon-coated microgrids or substrates in ultrahigh-vacuum conditions. In the low-energy part of the spectrum the measurements were performed in situ on freshly deposited samples, whereas in the high-energy range the samples were exposed to the atmosphere before the measurements. The extinction coefficient was calculated directly from the transmittance data, and a Kramers–Kronig analysis that combined the current data with data from the literature was performed to determine the dispersive part of the index of refraction. Finally, two different sum-rule tests were performed that indicated the good consistency of the data.
© 2007 Optical Society of America
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